atomic force microscope (afm) bruker 3a multimode 5 (Bruker Corporation)
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Bruker Corporation
atomic force microscope (afm) bruker 3a multimode 5
Atomic Force Microscope (Afm) Bruker 3a Multimode 5, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscope+(afm)+bruker+3a+multimode+5/atomic+force+microscope+dimension+icon/10__1021_slash_acs__macromol__9b01030-42-2-1
Average 90 stars, based on 1 article reviews
Atomic Force Microscope (Afm) Bruker 3a Multimode 5, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/atomic+force+microscope+(afm)+bruker+3a+multimode+5/atomic+force+microscope+dimension+icon/10__1021_slash_acs__macromol__9b01030-42-2-1
Average 90 stars, based on 1 article reviews
atomic force microscope (afm) bruker 3a multimode 5 - by Bioz Stars,
2026-09
90/100 stars
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other:Article Title: Defect Annihilation in the Directed Self-Assembly of Block Copolymers in Films with Increasing Thickness Article Snippet: We investigate directed self-assembly (DSA), with 3× density multiplication, of symmetric polystyrene-block-poly(methyl methacrylate) (L0 = 28 nm) with increasing film thicknesses and reveal a thickness limit above which the defect annihilation mechanism is different than in thinner films.. Block copolymer films of increasing thickness underwent DSA on a macroscopic chemical pattern under optimum geometrical and chemical conditions.. Scanning electron microscopy and grazing-incidence small-angle X-ray scattering (GISAXS) were used to characterize the long-range ordering and buried structures as a function of film thickness and thermal annealing time. |